-
Anglický jazyk
A Novel approach for Fault Tolerant Nano Memory Applications
Autor: Chinnala Pavan Kumar
NANOTECHNOLOGY provides smaller, faster, and lower energy devices which allow more powerful and compact circuitry; However, these benefits come with a cost-the nanoscale devices may be less reliable. Thermal- and shot-noise estimations alone suggest that... Viac o knihe
Na objednávku
33.30 €
bežná cena: 37.00 €
O knihe
NANOTECHNOLOGY provides smaller, faster, and lower energy devices which allow more powerful and compact circuitry; However, these benefits come with a cost-the nanoscale devices may be less reliable. Thermal- and shot-noise estimations alone suggest that the transient fault rate of an individual nanoscale device (e.g., transistor or nanowire) may be orders of magnitude higher than today's devices. A failure is said to have occurred in a circuit or system if it deviates from its specified behavior. A fault on the other hand is physical defect which may or may not cause a failure. The failure rate, also known as the hazard rate and defined as number of failures per unit time compared with the number of surviving components. A fault is characterized by its nature, value, extent & duration.
- Vydavateľstvo: LAP LAMBERT Academic Publishing
- Rok vydania: 2016
- Formát: Paperback
- Rozmer: 220 x 150 mm
- Jazyk: Anglický jazyk
- ISBN: 9783659894411
Nemecký jazyk 
