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Anglický jazyk
Advances in X-Ray Analysis
Autor: Gavin R. Mallett
The featured subject of the 1966 Denver X-Ray Conference was X-Ray Diffraction Topography and Dynamical X-Ray Phenomena. One of the chairmen of the featured ses sions, Professor R. A. Young, made the following remarks at the conclusion of his session. We... Viac o knihe
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O knihe
The featured subject of the 1966 Denver X-Ray Conference was X-Ray Diffraction Topography and Dynamical X-Ray Phenomena. One of the chairmen of the featured ses sions, Professor R. A. Young, made the following remarks at the conclusion of his session. We think they are quite appropriate to the occasion and with his permission we reproduce them here.
- Vydavateľstvo: Springer US
- Rok vydania: 2012
- Formát: Paperback
- Rozmer: 254 x 178 mm
- Jazyk: Anglický jazyk
- ISBN: 9781468478372
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