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Anglický jazyk
An Approach to mitigate Single Event Latch Up and Soft Errors
Autor: Amarish Dubey
Single Effect is a big challenge for VLSI Industries. All kind of Aircraft are suffering with this issue. So A excellent mitigation scheme is required to withstand with this issue. Keeping this issue in the mind, this book has been written. The book started... Viac o knihe
Na objednávku
45.36 €
bežná cena: 50.40 €
O knihe
Single Effect is a big challenge for VLSI Industries. All kind of Aircraft are suffering with this issue. So A excellent mitigation scheme is required to withstand with this issue. Keeping this issue in the mind, this book has been written. The book started with the semiconductor memories description then radiation effects and step by step to mitigation schemes. The mitigation schemes with effect at different parameters is also given with comparison so that a researcher can easily take reference and move for further research. This book is written in very easy and interesting language so that even a beginner can understand easily
- Vydavateľstvo: LAP LAMBERT Academic Publishing
- Rok vydania: 2012
- Formát: Paperback
- Rozmer: 220 x 150 mm
- Jazyk: Anglický jazyk
- ISBN: 9783659246685
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