-
Anglický jazyk
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Autor: Manoj Sachdev
The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions... Viac o knihe
Na objednávku
154.87 €
bežná cena: 175.99 €
O knihe
The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.
- Vydavateľstvo: Springer Netherlands
- Rok vydania: 2010
- Formát: Paperback
- Rozmer: 235 x 155 mm
- Jazyk: Anglický jazyk
- ISBN: 9789048178551
Nemecký jazyk 