• Anglický jazyk

CTL for Test Information of Digital ICs

Autor: Rohit Kapur

From the reviews: "[...] a welcome addition to the literature. [...] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer... Viac o knihe

Na objednávku

98.99 €

bežná cena: 109.99 €

O knihe

From the reviews: "[...] a welcome addition to the literature. [...] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields." Microelectronics Reliability

  • Vydavateľstvo: Springer US
  • Rok vydania: 2013
  • Formát: Paperback
  • Rozmer: 235 x 155 mm
  • Jazyk: Anglický jazyk
  • ISBN: 9781475778007

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