Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

Anglický jazyk

Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

Vydavateľstvo: Cambridge University Press
Rok vydania: 2011
Formát: Hardback
Rozmer: 260 x 183 mm
Jazyk: Anglický jazyk
ISBN: 9780521848756

Na objednávku

105.03 €

bežná cena: 116.70 €

O knihe

Now fully updated to cover recent developments, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms an up-to-date text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.