![Influence of Temperature on Microelectronics and System Reliability Influence of Temperature on Microelectronics and System Reliability](/buxus/images/cache/product_image_large/products/A38485503.jpeg)
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Anglický jazyk
Influence of Temperature on Microelectronics and System Reliability
Autor: Pradeep Lall
Na objednávku
61.47 €
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O knihe
- Vydavateľstvo: CRC Press
- Rok vydania: 2019
- Formát: Paperback
- Rozmer: 254 x 178 mm
- Jazyk: Anglický jazyk
- ISBN: 9780367400972