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Anglický jazyk
Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon
Autor: Peter Pichler
This book contains the first comprehensive review of intrinsic point defects, impurities and their complexes in silicon. Besides compiling the structures, energetic properties, identified electrical levels and spectroscopic signatures, and the diffusion... Viac o knihe
Na objednávku
290.39 €
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O knihe
This book contains the first comprehensive review of intrinsic point defects, impurities and their complexes in silicon. Besides compiling the structures, energetic properties, identified electrical levels and spectroscopic signatures, and the diffusion behaviour from investigations, it gives a comprehensive introduction into the relevant fundamental concepts.
- Vydavateľstvo: Springer Vienna
- Rok vydania: 2012
- Formát: Paperback
- Rozmer: 254 x 178 mm
- Jazyk: Anglický jazyk
- ISBN: 9783709172049
Nemecký jazyk 