• Anglický jazyk

Introduction to Atomic Force Microscopy

Autor: Ernesto Placidi

This book is addressed at students or researchers who want to deepen their understanding of the peculiar physical aspects of the various measurement modes in AFM that are often not discussed extensively in topical text books. Models for contact and adhesion... Viac o knihe

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O knihe

This book is addressed at students or researchers who want to deepen their understanding of the peculiar physical aspects of the various measurement modes in AFM that are often not discussed extensively in topical text books. Models for contact and adhesion between bodies are described in detail, so as done for the contact mode, the lateral force mode and the kinetic modes: a large section is dedicated to the physics of the harmonic oscillator interacting with a surface. A brief discussion about the technical aspects is also presented, without going into detail, as these are widely available elsewhere, in textbooks and even on internet sites.

  • Vydavateľstvo: Lulu.com
  • Rok vydania: 2017
  • Formát: Paperback
  • Rozmer: 246 x 189 mm
  • Jazyk: Anglický jazyk
  • ISBN: 9780244621087

Generuje redakčný systém BUXUS CMS spoločnosti ui42.