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Anglický jazyk
Lifetime aware device design using failure mechanism analysis
Autor: Senthilrani Shanmugavelu
As the device scales down, several serious design challenges emerges namely design complexity, power, crosstalk, delay and reliability. The design challenges are interrelated and a tradeoff has to be done for yielding a reliable structure for portable microelectronic... Viac o knihe
Na objednávku
58.78 €
bežná cena: 66.80 €
O knihe
As the device scales down, several serious design challenges emerges namely design complexity, power, crosstalk, delay and reliability. The design challenges are interrelated and a tradeoff has to be done for yielding a reliable structure for portable microelectronic devices in the DSM era.. By considering this, the book focuses on developing a reliability prediction system using failure mechanism analysis.The work suggests the ways to handle failure mechanisms to maintain the reliability of power semiconductor device. Hence, the need for a lifetime aware device design has been emphasized in this book.
- Vydavateľstvo: LAP LAMBERT Academic Publishing
- Rok vydania: 2017
- Formát: Paperback
- Rozmer: 220 x 150 mm
- Jazyk: Anglický jazyk
- ISBN: 9783330086937
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