- Anglický jazyk
MOS Interface Physics, Process and Characterization
Autor: Shengkai Wang
The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will... Viac o knihe
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O knihe
The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will be a reference for academics and postgraduates in the field of microelectronics.
- Vydavateľstvo: CRC Press
- Rok vydania: 2024
- Formát: Paperback
- Rozmer: 229 x 152 mm
- Jazyk: Anglický jazyk
- ISBN: 9781032106281