-
Anglický jazyk
Quantum Metrology, Imaging, and Communication
Autor: David S. Simon
This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates... Viac o knihe
Na objednávku
148.49 €
bežná cena: 164.99 €
O knihe
This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.
- Vydavateľstvo: Springer International Publishing
- Rok vydania: 2016
- Formát: Hardback
- Rozmer: 241 x 160 mm
- Jazyk: Anglický jazyk
- ISBN: 9783319465494
Nemecký jazyk 