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Anglický jazyk
Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
Autor: Chandra Shakher Pathak
This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a... Viac o knihe
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O knihe
This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.
- Vydavateľstvo: IntechOpen
- Rok vydania: 2022
- Formát: Hardback
- Rozmer: 266 x 185 mm
- Jazyk: Anglický jazyk
- ISBN: 9781839682292
Nemecký jazyk 