• Anglický jazyk

Scanning Electron Microscopy and X-Ray Microanalysis

Autor: Joseph Goldstein

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include... Viac o knihe

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O knihe

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.

  • Vydavateľstvo: Springer US
  • Rok vydania: 2013
  • Formát: Paperback
  • Rozmer: 254 x 178 mm
  • Jazyk: Anglický jazyk
  • ISBN: 9781461349693

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