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Anglický jazyk
Scanning Probe Microscopy
Autor: Alexei Gruverman
This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical... Viac o knihe
Na objednávku
266.31 €
bežná cena: 295.90 €
O knihe
This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.
- Vydavateľstvo: Springer New York
- Rok vydania: 2016
- Formát: Paperback
- Rozmer: 235 x 155 mm
- Jazyk: Anglický jazyk
- ISBN: 9781493950362
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