- Anglický jazyk
Structural, Syntactic, and Statistical Pattern Recognition
Autor: Andrea Torsello
This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2020, held in Padua, Italy, in January 2021.
The 35 papers presented in this volume were carefully...
Viac o knihe
Na objednávku
49.49 €
bežná cena: 54.99 €
O knihe
This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2020, held in Padua, Italy, in January 2021.
The 35 papers presented in this volume were carefully reviewed and selected from 81 submissions.
The accepted papers cover the major topics of current interest in pattern recognition, including classification and clustering, deep learning, structural matching and graph-theoretic methods, and multimedia analysis and understanding.
- Vydavateľstvo: Springer International Publishing
- Rok vydania: 2021
- Formát: Paperback
- Rozmer: 235 x 155 mm
- Jazyk: Anglický jazyk
- ISBN: 9783030739720