-
Anglický jazyk
Thermal Testing of Integrated Circuits
Autor: Antonio Rubio
Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state... Viac o knihe
Na objednávku
98.99 €
bežná cena: 109.99 €
O knihe
Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.
- Vydavateľstvo: Springer US
- Rok vydania: 2002
- Formát: Hardback
- Rozmer: 241 x 160 mm
- Jazyk: Anglický jazyk
- ISBN: 9781402070761
Nemecký jazyk 