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Anglický jazyk
Atom-Probe Field Ion Microscopy
Autor: Tien T. Tsong
The book will be of interest to scientists working on surfaces and interfaces of materials at the atomic level and will provide a useful reference for those using this technique.
Na objednávku, dodanie 2-4 týždne
62.28 €
bežná cena: 69.20 €
O knihe
The book will be of interest to scientists working on surfaces and interfaces of materials at the atomic level and will provide a useful reference for those using this technique.
- Vydavateľstvo: Cambridge University Press
- Rok vydania: 2005
- Formát: Paperback
- Rozmer: 234 x 156 mm
- Jazyk: Anglický jazyk
- ISBN: 9780521019934
Nemecký jazyk 