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Anglický jazyk
Atomic Force Microscopy Fundamentals and Applications
Autor: Vanarajsinh Solanki
This book focus upon AFM working principle, its different modes (i.e., contact, non-contact and tapping modes), analysis of some AFM result and few applications also. this book also underline the features of AFM as high versatile and useful morphological... Viac o knihe
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36.99 €
bežná cena: 41.10 €
O knihe
This book focus upon AFM working principle, its different modes (i.e., contact, non-contact and tapping modes), analysis of some AFM result and few applications also. this book also underline the features of AFM as high versatile and useful morphological tool to scan a large variety of surfaces, with a planar resolution ranging from nano -meter sclae down to atomic scale. We hope this book may helpful to researcher and student to understand the basic concept of AFM as well as performing with it for different kind of samples.
- Vydavateľstvo: LAP LAMBERT Academic Publishing
- Rok vydania: 2019
- Formát: Paperback
- Rozmer: 220 x 150 mm
- Jazyk: Anglický jazyk
- ISBN: 9786200247247
Nemecký jazyk 
