-
Anglický jazyk
Built-in-Self-Test and Digital Self-Calibration for RF SoCs
Autor: Mohammed Ismail
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in... Viac o knihe
Na objednávku, dodanie 2-4 týždne
49.49 €
bežná cena: 54.99 €
O knihe
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.
- Vydavateľstvo: Springer New York
- Rok vydania: 2011
- Formát: Paperback
- Rozmer: 235 x 155 mm
- Jazyk: Anglický jazyk
- ISBN: 9781441995476
Nemecký jazyk 
