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Anglický jazyk
CTL for Test Information of Digital ICs
Autor: Rohit Kapur
From the reviews: "[...] a welcome addition to the literature. [...] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer... Viac o knihe
Na objednávku, dodanie 2-4 týždne
98.99 €
bežná cena: 109.99 €
O knihe
From the reviews: "[...] a welcome addition to the literature. [...] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields." Microelectronics Reliability
- Vydavateľstvo: Springer US
- Rok vydania: 2013
- Formát: Paperback
- Rozmer: 235 x 155 mm
- Jazyk: Anglický jazyk
- ISBN: 9781475778007
Nemecký jazyk 
