• Anglický jazyk

Estimation of Lattice Strain by X-Ray Analysis

Autor: Nikita H. Patel

Wider Bandgap in II-VI semiconductor nanoparticles is important and advantageous for various potential applications including visible light photo-catalysis. Due to the presence of polycrystalline aggregates the crystallite size of the particles is not generally... Viac o knihe

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O knihe

Wider Bandgap in II-VI semiconductor nanoparticles is important and advantageous for various potential applications including visible light photo-catalysis. Due to the presence of polycrystalline aggregates the crystallite size of the particles is not generally the same as the particle size. Lattice strain is a measure of the distribution of lattice constants arising from crystal imperfections (lattice dislocation), triple junction, contact or sinter stresses, stacking faults, coherency stresses, etc. X-Ray Diffraction (XRD) analysis is powerful technique to estimate the crystallite size and lattice strain. In this present work, a comparative evaluation of the mean particle size of Ni doped CdS nanoparticles with different molar concentrations obtained from XRD broadening reported.

  • Vydavateľstvo: LAP LAMBERT Academic Publishing
  • Rok vydania: 2018
  • Formát: Paperback
  • Rozmer: 220 x 150 mm
  • Jazyk: Anglický jazyk
  • ISBN: 9783659950674

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