Examining Optoelectronics in Machine Vision and Applications in Industry 4.0, 1 volume

Anglický jazyk

Examining Optoelectronics in Machine Vision and Applications in Industry 4.0, 1 volume

Vydavateľstvo: Engineering Science Reference
Rok vydania: 2020
Formát: Hardback
Rozmer: 286 x 221 mm
Jazyk: Anglický jazyk
ISBN: 9781799865223

Na objednávku, dodanie 2-4 týždne

240.12 €

bežná cena: 266.80 €

O knihe

The research and exploitation of optoelectronic properties in the industrial branch of electronics is becoming more popular each day due to the important role they play in the development of a large variety of sensors, devices, and systems for identifying, measuring, and constructing. While optoelectronics study the applications of electronic devices that source, detect, and transform light, machine vision generates and detects light in order to provide imaging-based automatic inspections and analysis for such applications as automatic object and environmental inspection, process control, and robot/mobile machine guidance in industry. Machine vision is less efficient without optoelectronics, and thus, it is important to investigate the theoretical approaches to different optoelectronic devices available for machine vision as well as current scanning technologies. Examining Optoelectronics in Machine Vision and Applications in Industry 4.0 focuses on the examination of emerging technologies for the design, fabrication, and implementation of optoelectronic sensors, devices, and systems in a machine vision approach to support industrial, commercial, and scientific applications. The book covers topics such as the design, fabrication, and implementation of sensors and devices as well as the development viewpoint of optoelectronic systems and artificial vision techniques using optoelectronic devices. The interaction and informational communication between all these mentioned devices in the complex solution of the same task is the subject of modern challenges in Industry 4.0. Thus, this book supports engineers, technology developers, academicians, researchers, and students who seek machine vision techniques for detection, measurement, and 3D reconstruction.