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Anglický jazyk
Measurement of seeded defect width in the bearing using Sym5 wavelet
Autor: Manpreet Singh
This book is a great source for those who are working in the field of condition monitoring. Identifying the high frequency events in a signal is comparatively easy but this book elaborates about to spotting low frequency in detail which could be great source... Viac o knihe
Na objednávku, dodanie 2-4 týždne
60.12 €
bežná cena: 66.80 €
O knihe
This book is a great source for those who are working in the field of condition monitoring. Identifying the high frequency events in a signal is comparatively easy but this book elaborates about to spotting low frequency in detail which could be great source for the researchers working in this field. In addition, this book is an extract of different types of techniques being used in the field of condition monitoring.
- Vydavateľstvo: LAP LAMBERT Academic Publishing
- Rok vydania: 2017
- Formát: Paperback
- Rozmer: 220 x 150 mm
- Jazyk: Anglický jazyk
- ISBN: 9783330087262
Nemecký jazyk 
