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Anglický jazyk
New Horizons of Applied Scanning Electron Microscopy
Autor: Tomoaki Mitani
In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced... Viac o knihe
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O knihe
In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.
- Vydavateľstvo: Springer Berlin Heidelberg
- Rok vydania: 2009
- Formát: Hardback
- Rozmer: 241 x 160 mm
- Jazyk: Anglický jazyk
- ISBN: 9783642031595
Nemecký jazyk 