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Anglický jazyk
Power-Constrained Testing of VLSI Circuits
Autor: Bashir M. Al-Hashimi
This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing... Viac o knihe
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O knihe
This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.
- Vydavateľstvo: Springer US
- Rok vydania: 2003
- Formát: Hardback
- Rozmer: 241 x 160 mm
- Jazyk: Anglický jazyk
- ISBN: 9781402072352
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