Anglický jazyk

Quantum Metrology with Photoelectrons

Vydavateľstvo: IOP Concise Physics
Rok vydania: 2018
Formát: Hardback
Rozmer: 260 x 183 mm
Jazyk: Anglický jazyk
ISBN: 9781643270005

Na objednávku, dodanie 2-4 týždne

81.18 €

bežná cena: 90.20 €

O knihe

Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications.

Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on "complete" photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.