• Anglický jazyk

Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization

Autor: Chandra Shakher Pathak

This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a... Viac o knihe

Na objednávku, dodanie 2-4 týždne

119.43 €

bežná cena: 132.70 €

O knihe

This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.

  • Vydavateľstvo: IntechOpen
  • Rok vydania: 2022
  • Formát: Hardback
  • Rozmer: 266 x 185 mm
  • Jazyk: Anglický jazyk
  • ISBN: 9781839682292

Generuje redakčný systém BUXUS CMS spoločnosti ui42.