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Anglický jazyk
Recent Interferometry Applications in Topography and Astronomy
Autor: Ivan Padron
This book provides a current overview of the theoretical and experimental aspects of some interferometry techniques applied to Topography and Astronomy. The first two chapters comprise interferometry techniques used for precise measurement of surface topography... Viac o knihe
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O knihe
This book provides a current overview of the theoretical and experimental aspects of some interferometry techniques applied to Topography and Astronomy. The first two chapters comprise interferometry techniques used for precise measurement of surface topography in engineering applications; while chapters three through eight are dedicated to interferometry applications related to Earth's topography. The last chapter is an application of interferometry in Astronomy, directed specifically to detection of planets outside our solar system. Each chapter offers an opportunity to expand the knowledge about interferometry techniques and encourage researchers in development of new interferometry applications.
- Vydavateľstvo: IntechOpen
- Rok vydania: 2012
- Formát: Hardback
- Rozmer: 266 x 185 mm
- Jazyk: Anglický jazyk
- ISBN: 9789535104049
Nemecký jazyk 