-
Anglický jazyk
Scanning Electron Microscopy and X-Ray Microanalysis
Autor: Joseph Goldstein
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include... Viac o knihe
Na objednávku, dodanie 2-4 týždne
108.89 €
bežná cena: 120.99 €
O knihe
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
- Vydavateľstvo: Springer US
- Rok vydania: 2013
- Formát: Paperback
- Rozmer: 254 x 178 mm
- Jazyk: Anglický jazyk
- ISBN: 9781461349693
Nemecký jazyk 
