-
Anglický jazyk
Theoretical evaluation of reflectance in AL/SiO2 thin films
Autor: Jesús Javier Ortega Cabrera
The improvement of the optical properties of a material, such as reflectance, involves the complex search for the optimal experimental parameters in the process of obtaining them. The use of computational software for the simulation of these thin film growth... Viac o knihe
Na objednávku, dodanie 2-4 týždne
50.85 €
bežná cena: 56.50 €
O knihe
The improvement of the optical properties of a material, such as reflectance, involves the complex search for the optimal experimental parameters in the process of obtaining them. The use of computational software for the simulation of these thin film growth processes represents a substantial benefit due to the non dependence on a real system, as well as the possibility of exploring a wider range of physical quantities involved. In addition, there is a need in the automotive industry, Varroc Lighting Systems© has been given the task of improving the reflectance of aluminized headlights, so we carried out the development, using NASCAM® software, which uses the Monte Carlo kinetic method to develop a model of the physical system to be studied on a nanometric scale, this will allow us to analyze the influence of different magnitudes that can affect the reflectance of the material.
- Vydavateľstvo: Our Knowledge Publishing
- Rok vydania: 2021
- Formát: Paperback
- Rozmer: 220 x 150 mm
- Jazyk: Anglický jazyk
- ISBN: 9786203622201
Nemecký jazyk 
