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Anglický jazyk
Thermal-Aware Testing of Digital VLSI Circuits and Systems
Autor: Santanu Chattopadhyay
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level Describes range of algorithms for addressing thermal-aware test issue,... Viac o knihe
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O knihe
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips
- Vydavateľstvo: CRC Press
- Rok vydania: 2020
- Formát: Paperback
- Rozmer: 216 x 140 mm
- Jazyk: Anglický jazyk
- ISBN: 9780367607098
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