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Anglický jazyk
Thermal Reliability of Power Semiconductor Device in the Renewable Energy System
Autor: Xiong Du
This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental... Viac o knihe
Na objednávku, dodanie 2-4 týždne
148.49 €
bežná cena: 164.99 €
O knihe
This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device.
- Vydavateľstvo: Springer Nature Singapore
- Rok vydania: 2023
- Formát: Paperback
- Rozmer: 235 x 155 mm
- Jazyk: Anglický jazyk
- ISBN: 9789811931345
Nemecký jazyk 
